Mac-View Outline
The Mac-View is a SEM and TEM micrograph that is indispensible for research and development as well as quality control. The necessity to be able to analyze grain diameter and shape factor from images of particle assemblage is growing annually. The image analysis and grain size distribution measurement software “Mac-View” specializes in “powder analysis and control.” It is a powder-specialized image analysis tool that has both practical functions and is easy to use. Ver. 4, developed using feedback from our customer's, is enhanced to be even more functional and easy to use than ever before.
Mac-View Details
Generating particle images with the electron microgram. Measurement and analysis for each piece of data
Measurements can be made of any image due to the particle photograph, taken from the scanner and image data, being analyzed with the photograph scale. There is no upper or lower limit to the measurement range. The scanner is used to read the image data file and directly generate the photograph. An advanced analytical environment can be realized at a very reasonable cost.
Particle measurement and analysis using a combination of fully automatic/semi-automatic/manual recognition tools
Automatic particle recognition is possible when conditions have been set in detail. Remeasurement and analyzing images taken using the same sequence is a smooth process since processing history as well as measurement condition settings can be saved and retrieved at will. Speedy processing is also possible using the batch processing function for automatic particle recognition processes with the same sequences of steps. The simple semi-automatic and manual recognition tools can also assist greatly with their functionality and usability.The MacView has been equipped with a height/distance measurement function due to popular demand as well as functionality to handle images which had difficulty being recognized on previous systems. Additionally, each tool has been given a tune up so that the operator can utilize them that much easier. As an option, the system also comes with an LDC pen tablet that allows the operator to write directly on the monitor with a specialized pen, making particle recognition that much simpler.
Captured particle assemblage data can be output as particle size distribution data
The particle size distribution data is instantly displayed once the particles have been verified. Various configuration data that is difficult to understand by optical particle profiler can be analyzed graphically. Not only various particle sizes, but also a multitude of particle data ranging from aspect ratio, circularity coefficient, area, perimeter length, particle size distribution volume, area, particle quantity, length conversion, ON/PASS, peak data, data synthesis, and shape coefficient analysis can be analyzed*.
Batch saving/retrieving of measurement data. Output function of text, graphs, and image data
All data, including image data, can be bundled and saved together in a file. Even if the data is saved across multiple data files located in different sections of the hard disk, this data is easy to retrieve thanks to a data file search function that allows the user to search all data in specified folders and drives. In addition to the measurement results reports, text format and image data are selectable as outputs. Files can also be attached to the clipboard using user-defined conditions, so other applications can also be easily used to output data.
Combined with our ﾒMac-PIAS,ﾓ laser diffraction as well as matching up different types of data is possible.
Working in tandem with our powder analysis integrated software Mac-PIAS, which can control and analyze particle distribution data, total support over analyzing, controlling, and comparing different types of data is possible. Control over troublesome data is also easy.
*Available functions may change depending on the purchased license.
